C62.36-2000 IEEE Standard Test Methods for Surge Protectors by IEEE

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Additional info for C62.36-2000 IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits

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All rights reserved. 36-2000 IEEE STANDARD TEST METHODS FOR SURGE PROTECTORS USED IN Annex C (informative) Test measurement techniques This annex provides general guidance on test measurement techniques that have been useful in measuring the characteristics of surge protectors. 1 Safety The high voltage and current levels used in surge testing present possibly hazardous situations for personnel and equipment. In addition to the direct electrical hazards posed by surge test equipment, nonelectrical hazards exist, such as fire, heat, fragmentation, and fumes.

Measurement resolution of eight-bit digital oscilloscopes may have to be enhanced by sample averaging (which, for a single, captured transient waveform, has the effect of reducing the apparent bandwidth of the measurement), or by the use of a calibrated offset voltage to “window” the signal. Ten-bit oscilloscopes usually have sufficient resolution without the aid of these techniques. The oscilloscope should be capable of making differential measurements, and should be adjusted to display the actual waveform.

Then, connect a length of shorting conductor between the first probe at its point of connection to the circuit and the second, disconnected probe. The length of the shorting conductor should be such as to maintain the same probe spacing. This results in the two probes being connected together by the shorting conductor, but connected to the circuit at one point. A measurement is then made of the voltage across the shorting conductor when the test impulse is reapplied. This measurement is a good representation of any noise voltage that is present on the required signal.

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